When I learned that NEMA received an award from DHS to write a new Digital Communication in Security (DICOS) standard for airports, I couldn't help but think about the vital role nanotechnology will play in the functioning of critical sensor equipment used in high security facilities.  Yet the reliability of such nano-enabled technology cannot be assured unless there are standard repeatable and reproducible assessment methods.  Enter IEC TC 113.  TC 113 is where standards for reliability and durability assessments for nanoscale materials for electrotechnical applications are developed.  Companies who manufacture equipment for high security areas should join the U.S. Technical Advisory Group to IEC TC 113 and lead the international community in this standards activity.


Leave a Reply

Your email address will not be published. Required fields are marked *

*


three × 6 =

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <strike> <strong>