The technology required for high resolution imaging at 1/10 of a nanometer exists using atomic force microsopy (AFM). It is at this level of precision where it will be possible to fabricate consistent reliable nanoscale electrical contacts, linking microscopic technology to next generation end use products. For such contacts to be manufactured on a mass production basis, a standard is needed for properly fabricating these contacts.  The U.S. Technical Advisory Group to IEC TC 113 is prepared to lead in introducing a standards project on AFM for international consideration.  AFM equipment and nano-electrotechnical products and systems manufacturers should join the TAG to participate in this effort.


Leave a Reply

Your email address will not be published. Required fields are marked *

*


1 + seven =

You may use these HTML tags and attributes: <a href="" title=""> <abbr title=""> <acronym title=""> <b> <blockquote cite=""> <cite> <code> <del datetime=""> <em> <i> <q cite=""> <strike> <strong>