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Standard measurements needed for nanoscale electrical contacts

How will novel products from an emerging technology like nano-electrotechnology transition from lab to fab to mass production? Standards! Nano-electrotechnical products depend on reliable and durable electrical contacts at the nanoscale, but assessing this reliability depends on standard measurement methods.

Since atomic force microscopy (AFM) equipment is now available with resolution capabilities to 1/10th of a nanometer, international standards for measuring the reliability of nanoscale electrical contacts using AFM are needed. U.S.-based AFM equipment manufacturers should join the IEC TC 113 Technical Advisory Group to work with international partners to develop them.


Posted 08-17-2010 9:30 AM by Leibowitz, Mike

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